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  mosfet metaloxidesemiconductorfieldeffecttransistor coolmos?c7 600vcoolmos?c7powertransistor IPB60R060C7 datasheet rev.2.0 final powermanagement&multimarket
2 600vcoolmos?c7powertransistor IPB60R060C7 rev.2.0,2015-11-30 final data sheet d2pak 1description coolmos?c7isarevolutionarytechnologyforhighvoltagepower mosfets,designedaccordingtothesuperjunction(sj)principleand pioneeredbyinfineontechnologies. 600vcoolmos?c7seriescombinestheexperienceoftheleadingsj mosfetsupplierwithhighclassinnovation. the600vc7isthefirsttechnologyeverwithr ds(on) *abelow1ohm*mm2. features ?suitableforhardandsoftswitching(pfcandhighperformancellc) ?increasedmosfetdv/dtruggednessto120v/ns ?increasedefficiencyduetobestinclassfomr ds(on) *e oss andr ds(on) *q g ?bestinclassr ds(on) /package ?qualifiedforindustrialgradeapplicationsaccordingtojedec(j-std20 andjesd22) benefits ?increasedeconomiesofscalebyuseinpfcandpwmtopologiesinthe application ?higherdv/dtlimitenablesfasterswitchingleadingtohigherefficiency ?enablinghighersystemefficiencybylowerswitchinglosses ?increasedpowerdensitysolutionsduetosmallerpackages ?suitableforapplicationssuchasserver,telecomandsolar ?higherswitchingfrequenciespossiblewithoutlossinefficiencydueto loweossandqg applications pfcstagesandpwmstages(ttf,llc)forhighpower/performance smpse.g.computing,server,telecom,upsandsolar. pleasenote:formosfetparallelingtheuseofferritebeadsonthegate orseparatetotempolesisgenerallyrecommended. table1keyperformanceparameters parameter value unit v ds @ t j,max 650 v r ds(on),max 60 m w q g.typ 68 nc i d,pulse 135 a i d,continuous @ t j <150c 54 a e oss @400v 8.1 j body diode di/dt 420 a/s type/orderingcode package marking relatedlinks IPB60R060C7 pg-to 263 60c7060 see appendix a 1 2 3 tab d r a i n p i n 2 , t a b g a t e p i n 1 s o u r c e p i n 3
3 600vcoolmos?c7powertransistor IPB60R060C7 rev.2.0,2015-11-30 final data sheet tableofcontents description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 thermal characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 electrical characteristics diagrams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 test circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 package outlines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 appendix a . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 disclaimer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 1 2 3 tab d r a i n p i n 2 , t a b g a t e p i n 1 s o u r c e p i n 3
4 600vcoolmos?c7powertransistor IPB60R060C7 rev.2.0,2015-11-30 final data sheet 2maximumratings at t j =25c,unlessotherwisespecified table2maximumratings values min. typ. max. parameter symbol unit note/testcondition continuous drain current 1) i d - - - - 35 22 a t c =25c t c =100c pulsed drain current 2) i d,pulse - - 135 a t c =25c avalanche energy, single pulse e as - - 159 mj i d =6.4a; v dd =50v; see table 10 avalanche energy, repetitive e ar - - 0.80 mj i d =6.4a; v dd =50v; see table 10 avalanche current, single pulse i as - - 6.4 a - mosfet dv/dt ruggedness dv/dt - - 120 v/ns v ds =0...400v gate source voltage (static) v gs -20 - 20 v static; gate source voltage (dynamic) v gs -30 - 30 v ac (f>1 hz) power dissipation p tot - - 162 w t c =25c storage temperature t stg -55 - 150 c - operating junction temperature t j -55 - 150 c - mounting torque - - - n.a. ncm - continuous diode forward current i s - - 35 a t c =25c diode pulse current 2) i s,pulse - - 135 a t c =25c reverse diode dv/dt 3) dv/dt - - 20 v/ns v ds =0...400v, i sd <=9.9a, t j =25c see table 8 maximum diode commutation speed di f /dt - - 420 a/ m s v ds =0...400v, i sd <=9.9a, t j =25c see table 8 insulation withstand voltage v iso - - n.a. v v rms , t c =25c, t =1min 1) limited by t j max . 2) pulse width t p limited by t j,max 3) identical low side and high side switch 1 2 3 tab d r a i n p i n 2 , t a b g a t e p i n 1 s o u r c e p i n 3
5 600vcoolmos?c7powertransistor IPB60R060C7 rev.2.0,2015-11-30 final data sheet 3thermalcharacteristics table3thermalcharacteristics values min. typ. max. parameter symbol unit note/testcondition thermal resistance, junction - case r thjc - - 0.772 c/w - thermal resistance, junction - ambient r thja - - 62 c/w device on pcb, minimal footprint thermal resistance, junction - ambient for smd version r thja - 35 45 c/w device on 40mm*40mm*1.5mm epoxy pcb fr4 with 6cm2 (one layer, 70m thickness) copper area for drain connection and cooling. pcb is vertical without air stream cooling. soldering temperature, wave- & reflow soldering allowed t sold - - 260 c reflow msl1 1 2 3 tab d r a i n p i n 2 , t a b g a t e p i n 1 s o u r c e p i n 3
6 600vcoolmos?c7powertransistor IPB60R060C7 rev.2.0,2015-11-30 final data sheet 4electricalcharacteristics at t j =25c,unlessotherwisespecified table4staticcharacteristics values min. typ. max. parameter symbol unit note/testcondition drain-source breakdown voltage v (br)dss 600 - - v v gs =0v, i d =1ma gate threshold voltage v (gs)th 3 3.5 4 v v ds = v gs , i d =0.8ma zero gate voltage drain current i dss - - - 10 1 - m a v ds =600, v gs =0v, t j =25c v ds =600, v gs =0v, t j =150c gate-source leakage current i gss - - 100 na v gs =20v, v ds =0v drain-source on-state resistance r ds(on) - - 0.052 0.115 0.060 - w v gs =10v, i d =15.9a, t j =25c v gs =10v, i d =15.9a, t j =150c gate resistance r g - 0.8 - w f =1mhz,opendrain table5dynamiccharacteristics values min. typ. max. parameter symbol unit note/testcondition input capacitance c iss - 2850 - pf v gs =0v, v ds =400v, f =250khz output capacitance c oss - 54 - pf v gs =0v, v ds =400v, f =250khz effective output capacitance, energy related 1) c o(er) - 101 - pf v gs =0v, v ds =0...400v effective output capacitance, time related 2) c o(tr) - 1050 - pf i d =constant, v gs =0v, v ds =0...400v turn-on delay time t d(on) - 15.5 - ns v dd =400v, v gs =13v, i d =15.9a, r g =3.3 w ;seetable9 rise time t r - 11 - ns v dd =400v, v gs =13v, i d =15.9a, r g =3.3 w ;seetable9 turn-off delay time t d(off) - 79 - ns v dd =400v, v gs =13v, i d =15.9a, r g =3.3 w ;seetable9 fall time t f - 4 - ns v dd =400v, v gs =13v, i d =15.9a, r g =3.3 w ;seetable9 table6gatechargecharacteristics values min. typ. max. parameter symbol unit note/testcondition gate to source charge q gs - 14 - nc v dd =400v, i d =15.9a, v gs =0to10v gate to drain charge q gd - 23 - nc v dd =400v, i d =15.9a, v gs =0to10v gate charge total q g - 68 - nc v dd =400v, i d =15.9a, v gs =0to10v gate plateau voltage v plateau - 5.0 - v v dd =400v, i d =15.9a, v gs =0to10v 1)  c o(er) isafixedcapacitancethatgivesthesamestoredenergyas c oss while v ds isrisingfrom0to400v 2)  c o(tr) isafixedcapacitancethatgivesthesamechargingtimeas c oss while v ds isrisingfrom0to400v 1 2 3 tab d r a i n p i n 2 , t a b g a t e p i n 1 s o u r c e p i n 3
7 600vcoolmos?c7powertransistor IPB60R060C7 rev.2.0,2015-11-30 final data sheet table7reversediodecharacteristics values min. typ. max. parameter symbol unit note/testcondition diode forward voltage v sd - 0.9 - v v gs =0v, i f =15.9a, t j =25c reverse recovery time t rr - 390 - ns v r =400v, i f =15.9a,d i f /d t =100a/s; see table 8 reverse recovery charge q rr - 6 - c v r =400v, i f =15.9a,d i f /d t =100a/s; see table 8 peak reverse recovery current i rrm - 32 - a v r =400v, i f =15.9a,d i f /d t =100a/s; see table 8 1 2 3 tab d r a i n p i n 2 , t a b g a t e p i n 1 s o u r c e p i n 3
8 600vcoolmos?c7powertransistor IPB60R060C7 rev.2.0,2015-11-30 final data sheet 5electricalcharacteristicsdiagrams diagram1:powerdissipation t c [c] p tot [w] 0 25 50 75 100 125 150 0 20 40 60 80 100 120 140 160 180 p tot =f( t c ) diagram2:safeoperatingarea v ds [v] i d [a] 10 0 10 1 10 2 10 3 10 -3 10 -2 10 -1 10 0 10 1 10 2 10 3 1 s 10 s 100 s 1 ms 10 ms dc i d =f( v ds ); t c =25c; d =0;parameter: t p diagram3:safeoperatingarea v ds [v] i d [a] 10 0 10 1 10 2 10 3 10 -3 10 -2 10 -1 10 0 10 1 10 2 10 3 1 s 10 s 100 s 1 ms 10 ms dc i d =f( v ds ); t c =80c; d =0;parameter: t p diagram4:max.transientthermalimpedance t p [s] z thjc [k/w] 10 -5 10 -4 10 -3 10 -2 10 -1 10 -2 10 -1 10 0 0.5 0.2 0.1 0.05 0.02 0.01 single pulse z thjc =f( t p );parameter: d=t p / t 1 2 3 tab d r a i n p i n 2 , t a b g a t e p i n 1 s o u r c e p i n 3
9 600vcoolmos?c7powertransistor IPB60R060C7 rev.2.0,2015-11-30 final data sheet diagram5:typ.outputcharacteristics v ds [v] i d [a] 0 5 10 15 20 0 20 40 60 80 100 120 140 160 180 200 20 v 10 v 8 v 7 v 6 v 5.5 v 5 v 4.5 v i d =f( v ds ); t j =25c;parameter: v gs diagram6:typ.outputcharacteristics v ds [v] i d [a] 0 5 10 15 20 0 20 40 60 80 100 120 20 v 10 v 8 v 7 v 6 v 5.5 v 5 v 4.5 v i d =f( v ds ); t j =125c;parameter: v gs diagram7:typ.drain-sourceon-stateresistance i d [a] r ds(on) [ w ] 0 20 40 60 80 100 120 140 0.10 0.11 0.12 0.13 0.14 0.15 0.16 0.17 0.18 0.19 0.20 0.21 0.22 0.23 0.24 0.25 20 v 5.5 v 6 v 6.5 v 7 v 10 v r ds(on) =f( i d ); t j =125c;parameter: v gs diagram8:drain-sourceon-stateresistance t j [c] r ds(on)  [ w ] -50 -25 0 25 50 75 100 125 150 0.03 0.04 0.05 0.06 0.07 0.08 0.09 0.10 0.11 0.12 0.13 0.14 typ 98% r ds(on) =f( t j ); i d =15.9a; v gs =10v 1 2 3 tab d r a i n p i n 2 , t a b g a t e p i n 1 s o u r c e p i n 3
10 600vcoolmos?c7powertransistor IPB60R060C7 rev.2.0,2015-11-30 final data sheet diagram9:typ.transfercharacteristics v gs [v] i d [a] 0 2 4 6 8 10 12 0 20 40 60 80 100 120 140 160 180 200 150 c 25 c i d =f( v gs ); v ds =20v;parameter: t j diagram10:typ.gatecharge q gate [nc] v gs [v] 0 10 20 30 40 50 60 70 80 0 2 4 6 8 10 12 400 v 120 v v gs =f( q gate ); i d =15.9apulsed;parameter: v dd diagram11:forwardcharacteristicsofreversediode v sd [v] i f [a] 0.00 0.20 0.40 0.60 0.80 1.00 1.20 1.40 1.60 1.80 10 -1 10 0 10 1 10 2 125 c 25 c i f =f( v sd );parameter: t j diagram12:avalancheenergy t j [c] e as [mj] 25 50 75 100 125 150 0 20 40 60 80 100 120 140 160 e as =f( t j ); i d =6.4a; v dd =50v 1 2 3 tab d r a i n p i n 2 , t a b g a t e p i n 1 s o u r c e p i n 3
11 600vcoolmos?c7powertransistor IPB60R060C7 rev.2.0,2015-11-30 final data sheet diagram13:drain-sourcebreakdownvoltage t j [c] v br(dss) [v] -60 -30 0 30 60 90 120 150 520 540 560 580 600 620 640 660 680 700 v br(dss) =f( t j ); i d =1ma diagram14:typ.capacitances v ds [v] c [pf] 0 100 200 300 400 10 -1 10 0 10 1 10 2 10 3 10 4 10 5 ciss coss crss c =f( v ds ); v gs =0v; f =250khz diagram15:typ.cossstoredenergy v ds [v] e oss [j] 0 100 200 300 400 0 1 2 3 4 5 6 7 8 9 e oss = f (v ds ) 1 2 3 tab d r a i n p i n 2 , t a b g a t e p i n 1 s o u r c e p i n 3
12 600vcoolmos?c7powertransistor IPB60R060C7 rev.2.0,2015-11-30 final data sheet 6testcircuits table8diodecharacteristics table9switchingtimes table10unclampedinductiveload 1 2 3 tab d r a i n p i n 2 , t a b g a t e p i n 1 s o u r c e p i n 3 test circuit for diode characteristics diode recovery waveform t v , i i rrm i f v ds 10 % i rrm t rr t f t s q f q s di f / dt di rr / dt v ds ( peak ) q rr = q f + q s t rr = t f + t s v ds i f v ds i f r g 1 r g 2 r g 1 = r g 2 switching times test circuit for inductive load switching times waveform v ds v gs t d ( on ) t d ( off ) t r t on t f t off 10 % 90 % v ds v gs unclamped inductive load test circuit unclamped inductive waveform v ds v ( br ) ds i d v ds v ds i d
13 600vcoolmos?c7powertransistor IPB60R060C7 rev.2.0,2015-11-30 final data sheet 7packageoutlines figure1outlinepg-to263,dimensionsinmm/inches 1 2 3 tab d r a i n p i n 2 , t a b g a t e p i n 1 s o u r c e p i n 3 test circuit for diode characteristics diode recovery waveform t v , i i rrm i f v ds 10 % i rrm t rr t f t s q f q s di f / dt di rr / dt v ds ( peak ) q rr = q f + q s t rr = t f + t s v ds i f v ds i f r g 1 r g 2 r g 1 = r g 2 switching times test circuit for inductive load switching times waveform v ds v gs t d ( on ) t d ( off ) t r t on t f t off 10 % 90 % v ds v gs unclamped inductive load test circuit unclamped inductive waveform v ds v ( br ) ds i d v ds v ds i d
14 600vcoolmos?c7powertransistor IPB60R060C7 rev.2.0,2015-11-30 final data sheet 8appendixa table11relatedlinks ? ifxcoolmos tm c7webpage:  www.infineon.com ? ifxcoolmos tm c7applicationnote:  www.infineon.com ? ifxcoolmos tm c7simulationmodel:  www.infineon.com ? ifxdesigntools:  www.infineon.com 1 2 3 tab d r a i n p i n 2 , t a b g a t e p i n 1 s o u r c e p i n 3 test circuit for diode characteristics diode recovery waveform t v , i i rrm i f v ds 10 % i rrm t rr t f t s q f q s di f / dt di rr / dt v ds ( peak ) q rr = q f + q s t rr = t f + t s v ds i f v ds i f r g 1 r g 2 r g 1 = r g 2 switching times test circuit for inductive load switching times waveform v ds v gs t d ( on ) t d ( off ) t r t on t f t off 10 % 90 % v ds v gs unclamped inductive load test circuit unclamped inductive waveform v ds v ( br ) ds i d v ds v ds i d
15 600vcoolmos?c7powertransistor IPB60R060C7 rev.2.0,2015-11-30 final data sheet revisionhistory IPB60R060C7 revision:2015-11-30,rev.2.0 previous revision revision date subjects (major changes since last revision) 2.0 2015-11-30 release of final version welistentoyourcomments anyinformationwithinthisdocumentthatyoufeeliswrong,unclearormissingatall?yourfeedbackwillhelpustocontinuously improvethequalityofthisdocument.pleasesendyourproposal(includingareferencetothisdocument)to: erratum@infineon.com publishedby infineontechnologiesag 81726mnchen,germany ?2015infineontechnologiesag allrightsreserved. legaldisclaimer theinformationgiveninthisdocumentshallinnoeventberegardedasaguaranteeofconditionsorcharacteristics.with respecttoanyexamplesorhintsgivenherein,anytypicalvaluesstatedhereinand/oranyinformationregardingtheapplication ofthedevice,infineontechnologiesherebydisclaimsanyandallwarrantiesandliabilitiesofanykind,includingwithout limitation,warrantiesofnon-infringementofintellectualpropertyrightsofanythirdparty. information forfurtherinformationontechnology,deliverytermsandconditionsandpricespleasecontactyournearestinfineon technologiesoffice( www.infineon.com ). warnings duetotechnicalrequirements,componentsmaycontaindangeroussubstances.forinformationonthetypesinquestion, pleasecontactthenearestinfineontechnologiesoffice. theinfineontechnologiescomponentdescribedinthisdatasheetmaybeusedinlife-supportdevicesorsystemsand/or automotive,aviationandaerospaceapplicationsorsystemsonlywiththeexpresswrittenapprovalofinfineontechnologies,ifa failureofsuchcomponentscanreasonablybeexpectedtocausethefailureofthatlife-support,automotive,aviationand aerospacedeviceorsystemortoaffectthesafetyoreffectivenessofthatdeviceorsystem.lifesupportdevicesorsystemsare intendedtobeimplantedinthehumanbodyortosupportand/ormaintainandsustainand/orprotecthumanlife.iftheyfail,itis reasonabletoassumethatthehealthoftheuserorotherpersonsmaybeendangered. 1 2 3 tab d r a i n p i n 2 , t a b g a t e p i n 1 s o u r c e p i n 3 test circuit for diode characteristics diode recovery waveform t v , i i rrm i f v ds 10 % i rrm t rr t f t s q f q s di f / dt di rr / dt v ds ( peak ) q rr = q f + q s t rr = t f + t s v ds i f v ds i f r g 1 r g 2 r g 1 = r g 2 switching times test circuit for inductive load switching times waveform v ds v gs t d ( on ) t d ( off ) t r t on t f t off 10 % 90 % v ds v gs unclamped inductive load test circuit unclamped inductive waveform v ds v ( br ) ds i d v ds v ds i d


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